10 results
Development and Application of an Internet Electron Microscopy System for the Outreach Program in Japan
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 2 / April 2008
- Published online by Cambridge University Press:
- 03 March 2008, pp. 176-183
- Print publication:
- April 2008
-
- Article
- Export citation
TEM Sample Preparation Using a New Nanofabrication Technique Combining Electron-Beam-Induced Deposition and Low-Energy Ion Milling
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 545-548
- Print publication:
- December 2006
-
- Article
- Export citation
Public Opened Internet Electron Microscopy in Educational Field
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1566-1567
- Print publication:
- August 2004
-
- Article
- Export citation
Electron Beam Induced Depositions of Nano-dots by the Presence of the Partial Pressure of Precursor
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 540-541
- Print publication:
- August 2004
-
- Article
- Export citation
Direct UHV-TEM Observation of Palladium Clusters on a Silicon Surface
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
- Published online by Cambridge University Press:
- 22 January 2004, pp. 134-138
- Print publication:
- February 2004
-
- Article
- Export citation
Structural and Spectroscopic Study of Manganese Silicide Islands on Silicon
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 704 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, W9.8.1
- Print publication:
- 2001
-
- Article
- Export citation
Structural Fluctuations in Metal Nanoparticles
-
- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 718-719
- Print publication:
- August 1999
-
- Article
- Export citation
Focused Ion Beam Interfaced with a 200 keV Transmission Electron Microscope for In Situ Micropatterning on Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue 3 / June 1998
- Published online by Cambridge University Press:
- 28 July 2005, pp. 207-217
- Print publication:
- June 1998
-
- Article
- Export citation
Microstructural Observation of Focused Ion Beam Modification of Ni Silicide/Si Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 227
- Print publication:
- 1996
-
- Article
- Export citation
Microstructural Observation of Focused Ion Beam Modification of Ni Silicide/Si Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 438 / 1996
- Published online by Cambridge University Press:
- 03 September 2012, 313
- Print publication:
- 1996
-
- Article
- Export citation